Test automation

Results: 1201



#Item
891Electronic design automation / Automatic test pattern generation / Integrated circuits / Maintenance / Electronic design / Fault / Failure analysis / Semiconductor fault diagnostics / Design for testing / Electronic engineering / Geology / Design

White Paper Using TetraMAX® Physical Diagnostics for Advanced Yield Analysis Improving Defect Isolation with Layout Data January 2010

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-07 14:31:30
892Electronic design automation / Hillsboro /  Oregon / Synopsys / Physical design / Yield / Automatic test pattern generation / Test engineer / Electronic engineering / Mechanics / Physics

Datasheet Yield Explorer Design-centric yield management Identify and eliminate

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-07 14:34:57
893Electronic design / Integrated circuits / Electronics manufacturing / Automatic test pattern generation / Design closure / Test compression / Physical design / Scan chain / Timing closure / Electronic engineering / Electronic design automation / Electronics

White Paper Synthesis-Based Test for Maximum RTL Designer Productivity November 2010

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-07 14:32:21
894Integrated circuits / Electronic design / Software testing / Automatic test pattern generation / Scan chain / Code coverage / Automatic test equipment / Fault coverage / Electronic engineering / Electronics / Electronic design automation

Datasheet DFTMAX Ultra Compression for Highest Test Quality and Lowest Test Cost Overview

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-07 14:32:25
895Technology / Building automation / Heating /  ventilating /  and air conditioning / Sustainable building / Building biology / HVAC control system / Electricity meter / Home automation / HVAC / Energy / Building engineering / Electric power

IEEE DESIGN AND TEST, SPECIAL ISSUE ON GREEN BUILDINGS 1 From Buildings to Smart Buildings – Sensing and Actuation to Improve Energy Efficiency

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Source URL: www.synergylabs.org

Language: English - Date: 2013-01-16 02:13:44
896Electronic design automation / Electronic design / Integrated circuits / Scan chain / Automatic test pattern generation / Fault coverage / Electronics manufacturing / Test compression / Design for testing / Electronic engineering / Electronics / Design

White Paper DFTMAX Ultra New Technology to Address Key Test Challenges September 2013

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-07 14:32:17
897Software testing / Code refactoring / Software development process / Redesign / Unit testing / Technical debt / Self / Test automation / Database refactoring / Software development / Software / Extreme programming

A Field Study of Refactoring Challenges and Benefits Miryung Kim * [removed] Thomas Zimmermann + [removed]

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Source URL: thomas-zimmermann.com

Language: English - Date: 2012-07-21 19:37:18
898Engineering / Reliability engineering / Systems engineering / Automation / Test management tools / HP Application Lifecycle Management / Software testing / Evaluation / Quality assurance

! ! Quality Assurance Analyst - Intermediate Location: Halifax, Nova Scotia

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Source URL: www.kinduct.com

Language: English - Date: 2014-05-01 14:09:12
899Integrated circuits / Semiconductor device fabrication / Through-silicon via / Software testing / Electronic design / Automatic test pattern generation / Boundary scan / Automatic test equipment / Synopsys / Electronic engineering / Electronics / Technology

White Paper Test Automation of 3D Integrated Systems January 2012

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-07 12:41:47
900Test plan / Acceptance testing / Test automation / Software testing / FIPS 201 / Evaluation

Federal Identity, Credentialing, and Access Management Personal Identity Verification Interoperable (PIV-I) Test Plan Version[removed]Final

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Source URL: www.idmanagement.gov

Language: English - Date: 2013-06-21 15:29:46
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